Celentano G., Rizzo F., Augieri A., Masi A., Barba L., Campi G., Duchenko A., Varsano F., Plaisier J.R., Gigli L., Pompeo F.V.
Ключевые слова: chalcogenide, electrodeposition, films, fabrication, voltage, X-ray diffraction, microstructure, experimental results
Celentano G., Laviano F., Pinto V., Masi A., Angelis M.D., Tomellini M., Pietropaolo A., *3Torsello D.
Breschi M., Celentano G., Marzi G.D., Marchetti M., Savoldi L., Masi A., Castaldo A., Trotta A., Zanon F., Adibi S.A., Colombo G., Caponero M.A., Mazzotta C., Polimadei A.
Ключевые слова: sensors, quench detection, HTS, Bi2223, tapes, stacked blocks, cables, cooling technology, measurement setup, measurement technique, current-voltage characteristics
Ключевые слова: pnictides, oxygenation treatments, microstructure, atom probe tomography, resistance, composition, distribution, experimental results
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Augieri A., Piperno L., Masi A., Cialone M., Iebole M., Botti S., Bonfigli F., Savio L.
Ключевые слова: pnictides, fabrication, PIT process, polycrystalline, doping, substitution, pinning, critical caracteristics, Jc/B curves, magnetic moment, experimental results
Rufoloni A., Celentano G., Rizzo F., Augieri A., Pompeo N., Masi A., Barba L., Duchenko A., Varsano F.
Zenobio A.D., Chiarelli S., Rufoloni A., Vannozzi A., Turtu S., Celentano G., Augieri A., Muzzi L., Marzi G.D., Corte A.D., Messina G., Bragagni A., Seri M., Anemona A., Marchetti M., Formichetti A., Masi A., Giannini L., Arabi M.
Ключевые слова: fusion magnets, Al, Cu-based conductors, cable-in-conduit conductor, HTS, REBCO, coated conductors, tapes, stacked blocks, twisting, design, mechanical properties, strain effects, distribution, bending radius, critical current, current-voltage characteristics, resistance, numerical analysis
Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Ciccioli A., Augieri A., Armenio A.A., Masi A., Barba L., Duchenko A., Varsano F., Plaisier J.R., Gigli L.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Campagna E., Salvato M.
Rufoloni A., Vannozzi A., Celentano G., Augieri A., Corte A., Armenio A.A., Masi A., Duchenko A., Varsano F.
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Meledin A., Pinto V., Masi A., Orlanducci S., Santoni A., Ferrarese F.M.
Ключевые слова: HTS, YBCO, films epitaxial, GdBCO, YGdBCO, fabrication, chemical solution deposition, MOD process, substrate SrTiO3, pinning centers artificial, lattice parameter, X-ray diffraction, grain size, composition, microstructure, critical caracteristics, Jc/B curves, critical temperature, irreversibility fields, temperature dependence, critical current density, angular dependence, experimental results
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Barba L., Arrighetti G., Campi G.
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